The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high resolution x ray diffraction and topography it combines mathematical formalisms with graphical explanations and hands on practical advice for interpreting data. Over the last decade high resolution x ray diffractometry and topography have played a vital role in providing a better understanding of thin film materials and the development of high quality crystals for devices as the importance of high quality thin films and multilayer structures continues to grow more and more scientists and engineers have found that a knowledge of high resolution x . High resolution x ray diffractometry and topography bowen d keith tanner brian k isbn 9780850667585 kostenloser versand fur alle bucher mit versand und verkauf duch amazon. This book explores the area of x ray diffraction and the techniques available for deployment in research development and production it maps the theoretical and practical background necessary to study single crystal materials using high resolution x ray diffraction and topography it combines mathematical formalism with graphical explanations and hands on advice for interpreting data thus
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